Last edited by Elsevier
27.05.2021 | History

2 edition of Advances in Imaging and Electron Physics found in the catalog.

Advances in Imaging and Electron Physics

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        StatementElsevier
        PublishersElsevier
        Classifications
        LC Classifications2002
        The Physical Object
        Paginationxvi, 129 p. :
        Number of Pages51
        ID Numbers
        ISBN 100080526225
        Series
        1nodata
        2
        3
        Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. A Review of Image Segmentation Techniques Integrating Region and Boundary Information; I. Introduction; II. Embedded Integration; III. Postprocessing Integration; IV. Summary; V. Conclusions and Further Work; References; Chapter 2. Mirror Corrector for Low-Voltage Electron Microscopes; I. Introduction; II. General Considerations; III. The Spectromicroscope SMART; IV. Mechanical Design of the Mirror Corrector; V. Testing of the Mirror Corrector VI. ConclusionAppendix: Addition of Refractive Powers in the Two-Lens System; References; Chapter 3. Characterization of Texture in Scanning Electron Microscope Images; I. Introduction; II. The Variogram as a Surface Characterization Tool; III. Variogram Use for Texture Characterization of Digital Images; IV. Two Examples of Application in SEM Images; V. Conclusions; Appendix I: Correlation between Fourier Power Spectrum Maximum and Variogram Characteristic Minimum Appendix II: Theoretical Example to Show the Correlation between the Fourier Power Spectrum Maximum and the Variogram Characteristic MinimumReferences; Chapter 4. Degradation Identification and Model Parameter Estimation in Discontinuity-Adaptive Visual Reconstruction; I. Introduction; II. Fully Bayesian Approach to Unsupervised Blind Restoration; III. The MAP-ML Method; IV. MAP Estimation of the Image Field; V. ML Estimation of the Degradation Parameters; VI. ML Estimation of the Model Parameters; VII. The Overall Architecture for the Fully Blind and Unsupervised Restoration VIII. Adaptive Smoothing and Edge TrackingIX. Experimental Results: The Blind Restoration Subcase; X. Experimental Results: The Unsupervised Restoration Subcase; XI. Experimental Results: The Fully Unsupervised Blind Restoration Case; XII. Conclusions; References; Index

        Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. File Size: 10MB.


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Advances in Imaging and Electron Physics, Volume 211

Hence, it can provide a rough estimation only. United States Academic Press Inc. 765 External Cites per document 2004 0. 86 journal 8890 Academic Press Inc. 200 External Cites per document 2011 1. Year International Collaboration 1999 15.

Advances in Imaging and Electron Physics, 97 (Hardcover)

Wien Filter Instrumentation 1 Iron-free Coils 2 Generation of Quadrupole Fields 3 Double-Focus Wien Filter 4 Comments on the Wien Condition 5 Effect of Retarding Field Chapter Four. The time it takes from manuscript submission to final publication. The series features extended articles on the physics of electron devices especially semiconductor devicesparticle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

It considers the number of citations received by a journal and the importance of the journals from where these citations come.